Method, system, and computer program product to detect micron scale displacement of objects from a long range with and optical device and related computer implemented methods
US8270678B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 26, 2009 |
| Grant date | Sep 18, 2012 |
| Priority date | — |
| Expiry date | May 6, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30204
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of systems, program products, and computer implemented methods to measure the displacement of an object located in a hazardous or otherwise inaccessible location at a long range from an optical device with micron-level accuracy are provided the object being. The objects can be machinery, valves, containers, or any other object whose displacement is to be measured. The object can be located in radioactive, chemically reactive, high voltage, or otherwise hazardous or inaccessible locations that are not accessible for conventional displacement measurement by personnel. A system can comprise an identifier on the object to be tracked, an optical device, an computer with at least processing, storage, and memory facilities, and a communications network.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.