Noncontact anhysteric curve plotter and static field to time-varying hysteresisgraph with integrated temperature chamber
US8274278B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 10, 2009 |
| Grant date | Sep 25, 2012 |
| Priority date | — |
| Expiry date | Dec 14, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/0064
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automated, non-destructive anhysteretic magnetization characterization method for studying and modeling soft magnetic materials. This measurement method employs a “reading-waveform” that allows multiple points of reference to be established in tracing out the B waveform. In using the reference values from this waveform, the components of B that cannot be measured directly may be calculated with precision. In turn, the initial magnitude of the B waveform is identified as the unknown component of the anhysteretic state. The processes can be repeated for different values of static fields as well as a function of temperature to produce a family of anhysteretic magnetization curves. The core characterization was performed without physically altering the core, so that the true anhysteretic magnetization curve, and the true B-H loop under applied bias H, is measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.