Patent · US Active

Method for testing an electronics unit

US8274295B2 · kind B2 · utility

1Cited by

10References

9Claims

0Family size

Assignee

ENDRESS+HAUSER GMBH+CO.KG · DE

Inventors

Udo Grittke · Steinen, DE
Axel Humpert · Rheinau, DE
Dietmar Frühauf · Bad Kötzting, DE
Harald Schäuble · Lörrach, DE

Key dates

Filing date	Oct 2, 2007
Grant date	Sep 25, 2012
Priority date	—
Expiry date	Oct 12, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2829
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for testing an electronics unit, especially an electronics unit of an apparatus for ascertaining and/or monitoring a process variable, wherein the electronics unit has a plurality of electrical components. At least a part of the electrical components is grouped into at least one group, and this group is supplied with a query signal. A response signal is received from the group, and the response signal is evaluated. Furthermore, the invention relates to an apparatus for determining and/or monitoring a process variable.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.