Patent · US Active

Analytical laser ablation of solid samples for ICP, ICP-MS, and FAG-MS analysis

US8274735B2 · kind B2 · utility

12Cited by
3References
7Claims
0Family size

Inventors

Key dates

Filing dateSep 14, 2008
Grant dateSep 25, 2012
Priority date
Expiry dateDec 20, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/71
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention facilitates improvements in laser ablation of solid samples to be analyzed by an external inductively coupled plasma (ICP) emission spectrometer, ICP/mass-spectrometer (ICP-MS), or flowing afterglow (FAG) mass spectrometer (FAG-MS) for elemental analysis (ICP and ICP-MS) or molecular analysis (FAG-MS). A novel invention mirror-with-hole beam combiner eliminates chromatic aberration in the invention sample view and allows rad-hardening the laser ablation invention for use in a radiation hot cell for analysis of high activity nuclear waste. Many other novel invention rad-hardening attributes facilitate a comprehensive rad-hardened laser ablation system (the world's first). In other embodiments, invention novelties include unusually large homogeneous focused laser spot diameters, unusually long laser objective lens focal length, wide range operationally variable laser path length with built-in re-alignment, operationally variable demagnification ratio and diameter of the focused laser spot, the use of significantly higher powered SMR lasers in a large spot diameter to facilitate high sensitivity bulk analysis of solid samples, a demountable and gravitationally se…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.