Power measurement techniques of a system-on-chip (SOC)
US8275560B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 10, 2009 |
| Grant date | Sep 25, 2012 |
| Priority date | — |
| Expiry date | Dec 1, 2030 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D30/50
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system to enable power measurements of a system-on-chip in various modes. In one embodiment of the invention, the system-on-chip has full controllability of its logic and circuitry to facilitate configuration of the system-on-chip into a desired mode of operation. This allows hooks or interfaces to access the system-on-chip externally for measurements. For example, in one embodiment of the invention, the hooks in the system-on-chip allow a backend tester to configure the system-on-chip into various modes easily to perform power consumption measurements of one or more individual components of the system-on-chip. The power consumption measurement of the individual components in the system-on-chip can be performed faster and can be more accurate. In addition, the overall yield of the SOC can be increased as it is easier to detect failure parts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.