Patent · US Active

Polishing process for producing damage free surfaces on semi-insulating silicon carbide wafers

US8277671B2 · kind B2 · utility

4Cited by
11References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 18, 2007
Grant dateOct 2, 2012
Priority date
Expiry dateSep 8, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/8325
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

A polishing mixture and related method of polishing a material wafer surface, such as silicon carbide, are disclosed. The polishing mixture comprises; an abrasive and an oxidizer mixed in an acidic solution. Alumina may be used as the abrasive and the polishing mixture may have a pH less than or equal to seven (7).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.