Patent · US Active

Qualifying of a detector of noise peaks in the supply of an integrated circuit

US8283931B2 · kind B2 · utility

0Cited by

10References

19Claims

0Family size

Assignee

STMicroelectronics SA

Inventors

Alexandre Malherbe · Saint-Maximin-la-Sainte-Baume, FR
Benjamin Duval · Chambéry, FR

Key dates

Filing date	Jun 15, 2007
Grant date	Oct 9, 2012
Priority date	—
Expiry date	Jul 11, 2031

Classification

Technology area (CPC H)Electricity
CPC primaryH01L2924/0002
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and a system for qualifying an integrated circuit according to a parasitic supply peak detector that it contains, including: supply of the integrated circuit to be tested under at least a first voltage; checking of a starting of the circuit; application of at least one first noise peak on the circuit power supply, while respecting an amplitude and time gauge; and comparison of average currents consumed by the circuit before and after the peak.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.