System for adaptive three-dimensional scanning of surface characteristics
US8284240B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 30, 2009 |
| Grant date | Oct 9, 2012 |
| Priority date | — |
| Expiry date | Jul 30, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There are provided systems and methods for obtaining a three-dimensional surface geometric characteristic and/or texture characteristic of an object. A pattern is projected on a surface of said object. A basic 2D image of said object is acquired; a characteristic 2D image of said object is acquired; 2D surface points are extracted from said basic 2D image, from a reflection of said projected pattern on said object; a set of 3D surface points is calculated in a sensor coordinate system using said 2D surface points; and a set of 2D surface geometric/texture characteristics is extracted.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.