Method and device for characterising sensitivity to energy interactions in an electronic component
US8289038B2 · kind B2 · utility
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5References
9Claims
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Key dates
| Filing date | Apr 18, 2007 |
| Grant date | Oct 16, 2012 |
| Priority date | — |
| Expiry date | Nov 22, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
To analyze an electric component in depth, provision is made to submit the aforementioned component to focused laser radiation. It is shown that by modifying the altitude of the focus in the component, some internal parts of the aforementioned component can be characterized more easily.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.