System for the structured illumination of a sample
US8289622B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 17, 2008 |
| Grant date | Oct 16, 2012 |
| Priority date | — |
| Expiry date | Feb 14, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/06
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The invention relates to a structured illumination system (8) for the three-dimensional microscopy of a sample (14), that comprises: beam generation means (9, 10) adapted for generating coherent light beams (IN, I−N, I0); a lens (12) having a rear focal plane (PFA), and arranged so that the sample (14) can be placed in the focalisation plane (PMP) of the lens; focalisation means (19) arranged for focusing the light beams in the rear focal plane (PFA) so that the beams interfere in a collimated manner in the focalisation plane (PMP) of the lens (12); characterised in that the beam generation means (9, 10) includes a light space modulator (10) programmed for diffracting a light signal (22) in order to generate at least two different diffracted beams ((IN, I0), (I−N, I0)) that are not symmetrical relative to the lens optical axis, wherein the light space modulator includes a calculator adapted for applying a constant phase term to each of said at least two coherent beams.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.