Method, system and program product for optimizing event monitoring filter settings and metric threshold
US8291064B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 31, 2005 |
| Grant date | Oct 16, 2012 |
| Priority date | — |
| Expiry date | Nov 22, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/008
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Under the present invention indications of an event are monitored based upon a comparison of a computer system metric to a corresponding metric threshold over time. It is then determined whether a predetermined probability is reached that the indications will persist at least as long as a minimum detection and repair time for the event. Determining whether the predetermined probability is reached is typically accomplished based upon the monitoring of the indications over time and historical data for past instances of the event. The present invention will then optimize the filter setting for the event to minimize false positives and optimize the metric threshold so that indications are more accurately monitored.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.