Testing protocols for extended functionality cards
US8292164B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 10, 2009 |
| Grant date | Oct 23, 2012 |
| Priority date | — |
| Expiry date | Dec 26, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG07F7/0833
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
Testing is performed upon a transaction payment card having a substrate with opposing surfaces, battery powered circuit, and having memory in contact with the substrate to store data that includes an identifier for an account upon which a transaction can be conducted. An electronic component, in contact with the substrate, is powered by the battery powered circuit. In the testing, an electrical measurement is made of the battery powered circuit at each of different times when the card is exposed to an environmental condition. An output of the electrical measurements is made. The environmental condition can be temperature, current pulse applied at different states of charge of the one or more batteries, an acceleration, deceleration, or vibration for a period of time applied to card, a vacuum condition applied to the card, etc.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.