Mass spectrometric analyzer
US8294085B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 22, 2009 |
| Grant date | Oct 23, 2012 |
| Priority date | — |
| Expiry date | Dec 22, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/4245
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A mass spectrometric analyzer and an analysis method based on the detection of ion image current are provided. The method in one embodiment includes using electrostatic reflectors or electrostatic deflectors to enable pulsed ions to move periodically for multiple times in the analyzer, forming time focusing in a portion of the ion flight region thereof, and forming an confined ion beam in space; enabling the ion beam to pass through multiple tubular image current detectors arranged in series along an axial direction of the ion beam periodically, using a low-noise electronic amplification device to detect image currents picked up by the multiple tubular detectors differentially, and using a data conversion method, such as a least square regression, to acquire a mass spectrum.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.