System and auto-alignment method for determining position using a discrete contact probe
US8296962B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 24, 2010 |
| Grant date | Oct 30, 2012 |
| Priority date | — |
| Expiry date | Feb 6, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/0494
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system of aligning a probe to wells includes holding the probe at one potential and holding the wells at a different potential, moving the probe to an estimated center position above a selected well, lowering the probe into the selected target well, moving the probe in positive and negative directions along first and second axial dimensions until changes in potential are detected at the probe to indicate electrical contact between the probe and the selected well, and calculating a center location of the selected well along the first and second axial dimensions as mid-points between the points of contact for the respective axial dimensions. The method and system further include lowering the probe into contact with a floor of the selected well and calculating a center location along a third axial dimension as a predetermined distance above the position of the probe. The method and system determine center locations for other wells based on known spacing between wells and the calculated center locations of one or more selected wells.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.