Method of measuring coating thickness using infrared light
US8300232B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 19, 2009 |
| Grant date | Oct 30, 2012 |
| Priority date | — |
| Expiry date | Mar 20, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/0616
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring a thickness of a coating on a substrate material. A first pulse of monochromatic light having a predetermined first wavelength is emitted toward the coating and substrate material. A second pulse of monochromatic light having a predetermined second wavelength is emitted toward the coating and substrate material, the second wavelength being different than the first wavelength. A first elapsed time is measured from emission of the first pulse of light to reception of a reflection of the first pulse of light from a surface of the substrate material at an interface with the coating. A second elapsed time is measured from emission of the second pulse of light to reception of a reflection of the second pulse of light from an outer surface of the coating. A thickness of the coating is determined as a function of a difference between the first and second elapsed times.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.