Estimating spectral distribution of reflections from object surface based on low frequency illumination
US8300234B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 24, 2010 |
| Grant date | Oct 30, 2012 |
| Priority date | — |
| Expiry date | Apr 6, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/556
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for estimating the specular roughness of points on a surface of an object may include a lighting system, an image capture system and a computer processing system. The lighting system may be configured to illuminate the surface of the object at different times with different illumination patterns. Each illumination pattern may illuminate the surface from a plurality of different directions and form an intensity gradient having an order of no more than two. The image capture system may be configured to capture an image of the surface of the object when illuminated by each of the different illumination patterns at each of the different times. The computer processing system may be configured to compute the specular roughness of each point on the surface of the object based on the images captured by the image capture system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.