Testing system for flip type electronic device
US8302493B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 15, 2010 |
| Grant date | Nov 6, 2012 |
| Priority date | — |
| Expiry date | Apr 23, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01L5/0042
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing system is used to testing a flip type electronic device having a main body, and a cover. The testing system includes a fixing structure, a flipping structure, a sensing device, a rotating mechanism, and a control device. The fixing structure positions the main body. The fixing structure flips the cover until a rotation degree of the cover and the main body reaches a threshold degree. The sensing device senses is pressed by the cover when the cover automatically rotates relative to the main body and generates electrical pressure signals according to the mount of pressure. The control device controls the rotating mechanism to drive the flipping structure to rotate and judges whether the flipping performance of the electronic device is normal according to the electrical pressure signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.