Simulated mounting structure for testing electrical devices
US8305105B2 · kind B2 · utility
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1References
20Claims
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Key dates
| Filing date | Nov 12, 2008 |
| Grant date | Nov 6, 2012 |
| Priority date | — |
| Expiry date | Apr 16, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0408
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing apparatus or test jig is configured to accept a electrical device for testing prior to final assembly. In one example, a pair of conductive conveying belts compliantly engage a partially assembled photovoltaic (PV) module by its sides, and electrodes engage orthogonal sides of the module. The test apparatus or jig can be use for a variety of electrical tests, and may, for example be connected to a high potential (HiPot) tester.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.