Patent · US Active

Defect detection on optical fiber specimen using 3D surface data

US8306760B1 · kind B1 · utility

7Cited by

1References

20Claims

0Family size

Assignee

Promet International, Inc. · US

Inventors

Peter David Koudelka · Windom, US
Eric Karl Lindmark · Mölndal, SE
Alan Blair · Launceston, AU

Key dates

Filing date	Jun 22, 2009
Grant date	Nov 6, 2012
Priority date	—
Expiry date	Oct 2, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/45
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A computing system includes an interferometer and a processor. The interferometer is configured to generate at least two phase shifted images of an optical fiber specimen. The processor is configured to acquire the at least two phase shifted images from the interferometer, generate a first intermediate data set based on the at least two acquired phase shifted images and perform two-dimensional defect detection on the first intermediate data set.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.