Method, system and test platform for testing output of electrical device
US8306770B2 · kind B2 · utility
1Cited by
6References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 19, 2010 |
| Grant date | Nov 6, 2012 |
| Priority date | — |
| Expiry date | Mar 22, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/04
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for testing output of an electrical device includes the following steps: a device being tested transmits a first signal to a test platform through a channel being tested. A signal received through the channel being tested by the test platform is compared with the first signal to determine if the received signal corresponds to the first signal. The channel being tested is determined to be normal if the received signal corresponds to the first signal. The channel being tested is determined to be abnormal if the received signal does not correspond to the first signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.