Method for estimating temperature at a critical point
US8306772B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 13, 2008 |
| Grant date | Nov 6, 2012 |
| Priority date | — |
| Expiry date | Jan 11, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K1/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatuses are disclosed to estimate temperature at one or more critical points in a data processing system comprising modeling a steady state temperature portion of a thermal model at the one or more critical points using regression analysis; modeling the transient temperature portion of the thermal model at the one or more critical points using a filtering algorithm; and generating a thermal model at the one or more critical points by combining the steady state temperature portion of the thermal model with the transient temperature portion of the thermal model. The thermal model may then be used to estimate an instantaneous temperature at the one or more critical points or to predict a future temperature at the one or more critical points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.