Two mode vapor/particulate sampling device
US8307724B1 · kind B1 · utility
7Cited by
21References
42Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 20, 2009 |
| Grant date | Nov 13, 2012 |
| Priority date | — |
| Expiry date | Dec 7, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/028
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The improved analyte collection device is adjustable between two separate and distinct configurations. The first configuration enhances analyte collection by precluding undesired gas flow from around the sampling device. The second configuration enhances analyte collection by extending and focusing gas flow into the sampling device. Additionally, the current invention provides methods for collecting analyte from the surface of objects or the atmosphere.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.