Analyzing device and analyzing method
US8310678B2 · kind B2 · utility
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2Claims
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Key dates
| Filing date | Jan 22, 2009 |
| Grant date | Nov 13, 2012 |
| Priority date | — |
| Expiry date | Sep 30, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8483
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a device in which light from a sample 7 fixed in a test piece 1 is captured by an image sensor 5 through an optical system made up of a lens 3, a diaphragm 4, and so on and concentration information is obtained, wherein a wide-band light source 12 for illuminating the test piece 1 is combined with an optical filter 13 for optionally selecting a wavelength of the light captured by the image sensor. Thus it is possible to reduce a measurement error caused by a change of the light quantity distribution of the light source 12.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.