Imaging inspection apparatus incorporating a device for solving cubic polynomials
US8311313B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 8, 2010 |
| Grant date | Nov 13, 2012 |
| Priority date | — |
| Expiry date | Jun 3, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/643
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An imaging inspection machine for inspecting objects located within articles, with the imaging inspection machine having an inspection location for articles having a quantity of objects located along a path of travel through an inspection location located within the imaging inspection machine. Imaging inspection devices are positioned on the frame and adapted for directing beams through articles as articles move through the inspection location within the imaging inspection machine. As a result of inspecting the articles, output signals are applied to a processing and analysis assembly which performs only simple table lookups into an appropriately formed table and one multiplication for each pixel to correct nonlinearities matched by a cubic polynomial.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.