Patent · US Active

Magnetic particle inspection apparatus and method

US8314611B2 · kind B2 · utility

1Cited by

7References

19Claims

0Family size

Assignee

General Electric Company · US

Inventors

John R. M. Viertl · Niskayuna, US
Manu Mathai · Chennai, IN
Grady Baggett · Simpsonville, US

Key dates

Filing date	Jan 8, 2010
Grant date	Nov 20, 2012
Priority date	—
Expiry date	Jan 14, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/0213
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A magnetic particle inspection (MPI) apparatus is disclosed that includes a chordal field coil pair and a radial field coil pair. The chordal field coil pair includes first and second chordal field coils configured to produce a chordally oriented magnetic flux about a test article.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.