Patent · US Active

Methods and apparatus for analyzing samples and collecting sample fractions

US8314934B2 · kind B2 · utility

1Cited by

43References

20Claims

0Family size

Assignee

Alltech, Inc. · US

Inventors

James M. Anderson · Cohoes, US
Raaidah Saari-Nordhaus · Antioch, US
Washington Mendoza · Lake in the Hills, US
Josef Bystron · Chicago, US
Dirk Helgemo · Shakopee, US

Key dates

Filing date	Dec 3, 2010
Grant date	Nov 20, 2012
Priority date	—
Expiry date	Dec 3, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG01N30/88
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Methods and apparatus for analyzing a sample using at least one detector are disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.