Patent · US Active

Method for carrying out a self-test for a micromechanical sensor device, and corresponding micromechanical sensor device

US8316688B2 · kind B2 · utility

1Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 1, 2010
Grant dateNov 27, 2012
Priority date
Expiry dateFeb 2, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D2218/10
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for carrying out a self-test for a micromechanical sensor device, and a corresponding micromechanical sensor device. The method has the following steps: exciting the sensor device using a first excitation signal variation in a first self-test; storing a corresponding first response signal variation of the sensor device; exciting the sensor device using a second excitation signal variation in a second self-test; storing a corresponding second response signal variation of the sensor device; analyzing the first and second response signal variations with regard to at least one predefined criterion; and preparing a self-test result based on the analytical result of the first and second response signal variations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.