Method for carrying out a self-test for a micromechanical sensor device, and corresponding micromechanical sensor device
US8316688B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 1, 2010 |
| Grant date | Nov 27, 2012 |
| Priority date | — |
| Expiry date | Feb 2, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D2218/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for carrying out a self-test for a micromechanical sensor device, and a corresponding micromechanical sensor device. The method has the following steps: exciting the sensor device using a first excitation signal variation in a first self-test; storing a corresponding first response signal variation of the sensor device; exciting the sensor device using a second excitation signal variation in a second self-test; storing a corresponding second response signal variation of the sensor device; analyzing the first and second response signal variations with regard to at least one predefined criterion; and preparing a self-test result based on the analytical result of the first and second response signal variations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.