Patent · US Active

Substrate analysis systems

US8318094B1 · kind B1 · utility

63Cited by

12References

15Claims

0Family size

Assignee

PACIFIC BIOSCIENCES OF CALIFORNIA, INC. · US

Inventors

Hovig Bayandorian · Berkeley, US
Yujuan CHENG · Foster City, US
John Dixon · Moss Beach, US
Kevin Hester · Belmont, US
Yanqiao Huang · Shantou, CN
Paul Lundquist · San Francisco, US
Joy Roy · San Jose, US
Stephen Turner · Menlo Park, US
Peiqian Zhao · Palo Alto, US
Cheng Frank Zhong · Tianjin, CN

Key dates

Filing date	Jun 16, 2011
Grant date	Nov 27, 2012
Priority date	—
Expiry date	Jun 16, 2031

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10T436/11
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

This invention provides systems for analyzing substrates. Also provided by the invention are improved optical systems for enhanced multiplex illumination, optical systems with compact multi-wavelength illumination architectures, optical systems for enhanced detection of optical signals, and optical systems for reduced autofluorescence background noise.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.