Patent · US Active

Analysis system for analyzing a sample on a test element

US8318106B2 · kind B2 · utility

1Cited by

13References

36Claims

0Family size

Assignee

Roche Diagnostics Operations, Inc. · US

Inventors

Paul Jansen · Mannheim, DE
Jochen Schulat · Mannheim, DE
Yvonne Ringelspacher · Waldsee, DE

Key dates

Filing date	Jul 26, 2005
Grant date	Nov 27, 2012
Priority date	—
Expiry date	Mar 25, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01N33/4875
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to an analysis system for analyzing a sample on a test element. The system has an analysis unit for generating a signal as a function of an analyte contained in a sample, and a detection unit for detecting the signal. The analysis system further includes a test element holder into which the test element can be reversibly introduced and in which it can be positioned relative to the analysis unit and the detection unit. The test element contains at least one guide element, which is suitable for laterally guiding the test element, so that the test element in the test element holder is held and guided only on an outer region of the test element, and an inner region of the test element introduced into the test element holder remains free. The test element contains a sample application site in the inner region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.