System and method for multiple view machine vision target location
US8321055B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 3, 2009 |
| Grant date | Nov 27, 2012 |
| Priority date | — |
| Expiry date | Dec 20, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/00752
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A machine vision system for controlling the alignment of an arm in a robotic handling system. The machine vision system includes an optical imager aligned to simultaneously capture an image that contains a view of the side of an object, such as a test tube, along with a view of the top of the object provided by a mirror appropriately positioned on the robotic arm. The machine vision system further includes a microcontroller or similar device for interpreting both portions of the image. For example, the microcontroller may be programmed to determine the location of the object in the reflected portion of the image and transpose that information into the location of the object relative to the robotic arm. The microcontroller may also be programmed to decode information positioned on the object by interpreting visual information contained in the other portion of the captured image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.