System and method to measure capacitance of capacitive sensor array
US8321174B1 · kind B1 · utility
22Cited by
363References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 26, 2008 |
| Grant date | Nov 27, 2012 |
| Priority date | — |
| Expiry date | Jun 24, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/04166
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for measuring capacitance of a capacitive sensor array is disclosed. Upon measuring the capacitance, position information with respect to the sensor array may be determined. A column, a first row, and a second row of a capacitive sensor array may be selected. The first row and the second row intersect with the column of the capacitive sensor array. A differential capacitance between the first row and the second row may be measured. The differential capacitance may be utilized in determining a location of an object proximate to the capacitive sensor array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.