Dual chamber, multi-analyte test strip with opposing electrodes
US8323467B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 27, 2009 |
| Grant date | Dec 4, 2012 |
| Priority date | — |
| Expiry date | Feb 14, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/00118
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A dual chamber, multi-analyte test strip has a first insulating layer, a first electrically conductive layer, with a first working electrode, disposed on the first insulating layer and a first patterned spacer layer positioned above the first electrically conductive layer. The first patterned spacer layer has a first sample-receiving chamber, with first and second end openings, defined therein that overlies the first working electrode. The test strip also includes a first counter/reference electrode layer that is exposed to the first sample receiving chamber and is in an opposing relationship to the first working electrode. The test strip further includes a counter/reference insulating layer disposed over the first counter/reference electrode layer and a second counter/reference electrode layer disposed on the counter/reference substrate. Also included in the test strip is a second patterned spacer layer that is positioned above the second counter/reference electrode layer. The second patterned spacer layer has a second sample-receiving chamber, with first and second end openings, defined therein. The test strip additionally has a second electrically conductive layer, with a second…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.