Probe tip

US8327727B2 · kind B2 · utility

Assignee

• Lake Shore Cryotronics, Inc. · US

Inventors

• Jason C. Caudill · Sunbury, US
• Edward C. Maloof · Blacklick, US
• Masaki Yamaguchi · Gifu, JP
• Shin Mizuta · Osaka, JP

Key dates

• Filing date: Aug 25, 2009
• Grant date: Dec 11, 2012
• Expiry date: Feb 28, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2863
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

To eliminate or otherwise reduce unintended movement of a probe tip of a probe assembly being held by a probe arm, the probe assembly includes one or more resilient members that compensate for the contraction or expansion of the probe arm in accordance with the coefficient of thermal expansion of the material from which the probe arm is made. Thus, the probe tip can remain in contact with a sample being measured at the desired location on the sample, during an automated full or wide scale temperature range sweep.