Patent · US Active

Methods for damage etch and texturing of silicon single crystal substrates

US8329046B2 · kind B2 · utility

2Cited by
10References
9Claims
0Family size

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Key dates

Filing dateFeb 5, 2009
Grant dateDec 11, 2012
Priority date
Expiry dateMay 16, 2030

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E10/50

Abstract

Methods for performing damage etch and texturing of single crystal silicon substrates, particularly for use as solar cells or photovoltaic cells. Damage etch with a TMAH solution followed by texturing using solution of KOH or NaOH mixed with IPA is particularly advantageous. The substitution of some of the IPA with ethylene glycol further improves results. Also disclosed is a process that combines both damage etch and texturing etch into a single step.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.