Patent · US Active

Measurement device with at least one sensor

US8329104B2 · kind B2 · utility

3Cited by

4References

19Claims

0Family size

Assignee

Micronas GmbH · DE

Inventors

Mirko Lehmann · Glückstadt, DE
Ingo Freund · Endingen am Kaiserstuhl, DE
Sonja Mohry · Glückstadt, DE
Holger Klapproth · Glückstadt, DE

Key dates

Filing date	Jun 26, 2008
Grant date	Dec 11, 2012
Priority date	—
Expiry date	Feb 8, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01N27/4163
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measurement device has at least one sensor for detecting a parameter, a data storage unit, and a power supply for said sensor and data storage unit. In addition to the first sensor, the measurement device has at least one second sensor connected to the power supply and to the data storage unit. The second sensor is provided for detecting a physical quantity acting on the first sensor and is capable of permanently altering the measurement characteristic of the first sensor. An evaluator functions coactively with the second sensor and the data storage unit so that the permanent alteration of the measurement characteristic of the first sensor is recordable as a function of the measurement signal of the second sensor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.