Device for analysis of a sample on a test element

US8330046B2 · kind B2 · utility

Assignee

• Roche Diagnostics Operations, Inc. · US

Inventors

• Stefan Riebel · Frankfurt am Main, DE
• Manfred Augstein · Mannheim, DE
• Gregor Bainczyk · Mannheim, DE
• Albert Grosser · Düsseldorf, DE
• Oliver Kube · Worms, DE
• Dieter Meinecke · Mannheim, DE
• Bruno Thos · Quierschied, DE
• Herbert Wieder · Mannheim, DE

Key dates

• Filing date: Apr 18, 2008
• Grant date: Dec 11, 2012
• Expiry date: Oct 12, 2031

Classification

• Technology area (CPC A): Human Necessities
• CPC primary: A61B5/14532
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An analysis device for analysis of a sample on a test element is provided that comprises at least one component configured to make electrical contact with at least one other component for electrical transmission therebetween. The at least one component generally comprises an injection-molded circuit mount, also called an MID, or molded interconnect device.