Patent · US Active

Operating parameter monitoring circuit and method

US8330478B2 · kind B2 · utility

5Cited by
7References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 3, 2009
Grant dateDec 11, 2012
Priority date
Expiry dateMar 22, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2621
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A monitoring circuit 14, 16, 18, 20, 22 for monitoring an operating parameter of an integrated circuit 2 comprises a ring oscillator circuit 80 comprising a plurality of serially connected inverting stages 82-1, 82-2, 82-3. At least one of the inverting stages 82-1, 82-2 comprises at least one leakage transistor 64-1, 64-2 which is configured to operate in a leakage mode in which substantially all current through the at least one leakage transistor is a leakage current, and a capacitive element 70-1 arranged to be charged or discharged in dependence on the leakage current. The ring oscillator circuit 80 thus generates an oscillating signal with an oscillation period dependent on a rate at which the capacitive element 70-1 is charged or discharged. The operating parameter controls a magnitude of the leakage current so that the oscillation period indicates the operating parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.