Solid state drive systems and methods of reducing test times of the same
US8331175B2 · kind B2 · utility
2Cited by
4References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 9, 2009 |
| Grant date | Dec 11, 2012 |
| Priority date | — |
| Expiry date | Sep 10, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/2602
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to example embodiments, a solid state drive system includes at least one semiconductor memory, a control circuit including first connection terminals, and second connection terminals. The first connection terminals may be configured to supply one or more operational voltages to the at least one semiconductor memory. The second connection terminals may be configured to supply one or more test voltages to the at least one semiconductor memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.