Method and system for evaluating effects of signal phase difference on a memory system
US8331176B2 · kind B2 · utility
16Cited by
14References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 30, 2009 |
| Grant date | Dec 11, 2012 |
| Priority date | — |
| Expiry date | Oct 18, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In an embodiment, the effect of signal phase difference on a memory system is tested for various operating states. The various operating states may be represented as respective sample points on a plane defined by a range of values for a difference in signal phases and a range of values for another operating state parameter. In various embodiments, sample points for a round of crosstalk testing may include two sample points which are offset from the same reference point on the plane along different respective axes, where the axes are oblique to one another.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.