Patent · US Active

Methods, systems and apparatus for defect detection

US8331650B2 · kind B2 · utility

3Cited by

18References

24Claims

0Family size

Assignee

Sharp Laboratories of America, Inc. · US

Inventors

Chang Yuan · Los Gatos, US
Masakazu Yanase · Vancouver, US
Xinyu Xu · Shanghai, CN

Key dates

Filing date	Jul 29, 2010
Grant date	Dec 11, 2012
Priority date	—
Expiry date	Jun 9, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/20081
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Aspects of the present invention are related to systems, methods and apparatus for image-based automatic defect detection.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.