Oscilloscope probe calibrating system
US8332175B2 · kind B2 · utility
Assignees
Inventor
Key dates
| Filing date | Aug 16, 2010 |
| Grant date | Dec 11, 2012 |
| Priority date | — |
| Expiry date | Jun 17, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An oscilloscope probe calibrating system for a single terminal probe and a differential probe includes an oscilloscope, a main branch module, a sub-branch module, and a resistor. The oscilloscope includes multiple inputs for receiving signals from the single terminal probe and the differential probe, an output for outputting an original calibration signal, and a display module displaying the waveforms of the original calibration signal and the signals from the single terminal probe and the differential probe. The main branch module converts the original calibration signals to a number of first calibration signals. The sub-branch module converts the first calibration signals to a number of second calibration signals. The sub-branch module includes a single terminal sub-branch module and a differential sub-branch module coupled to the main branch module. One end of the resistor is connected between the main branch module and the differential sub-branch module, and the other end is grounded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.