Data storage device tester
US8332695B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2010 |
| Grant date | Dec 11, 2012 |
| Priority date | — |
| Expiry date | Feb 10, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B27/36
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises a plurality of bays, a screen, and control circuitry operable to detect when a first DSD has been inserted into a first bay. Independent of operator input, a graphical user interface (GUI) displayed on the screen is automatically updated to reflect the first DSD has been inserted into the first bay. Independent of operator input, a DSD test is automatically executed on the first DSD. When the first DSD is removed from the first bay, independent of operator input, the GUI is automatically updated to reflect the first DSD has been removed from the first bay.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.