Mass spectrometer system
US8334504B2 · kind B2 · utility
37Cited by
2References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 19, 2010 |
| Grant date | Dec 18, 2012 |
| Priority date | — |
| Expiry date | Jun 28, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/16
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
This invention describes an analytical system where a kinetic impact ionization source is combined with an RF-only ion guide to form a mass spectrometer system for analysis of the elemental and chemical composition of exoatmospheric particles. The kinetic impact ionization source may be used to transform a flux of particle debris into a beam of ions for analysis by a mass analyzer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.