Patent · US Active

Repairing defects

US8334701B2 · kind B2 · utility

1Cited by

6References

24Claims

0Family size

Assignee

Carl Zeiss NTS GmbH · US

Inventors

Rainer Knippelmeyer · Utting am Ammersee, DE
Christoph Riedesel · Aalen, DE
John Morgan · Albuquerque, US
Lawrence Scipioni · Beaverton, US

Key dates

Filing date	Aug 28, 2009
Grant date	Dec 18, 2012
Priority date	—
Expiry date	Apr 23, 2031

Classification

Technology area (CPC H)Electricity
CPC primaryH05K2203/173
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

Methods and systems for defect repair are disclosed. The methods include: (a) identifying a defect causing an absence of an electrical connection between a first circuit element and a second circuit element, the first and second circuit elements being positioned in or on a substrate and the defect being positioned in the substrate; (b) removing a portion of the substrate to expose the defect, and depositing a conductive material to electrically connect the first and second circuit elements; and (c) verifying that the defect caused the absence of an electrical connection between the first and second circuit elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.