Second-order nonlinear susceptibility of a nanoparticle using coherent confocal microscopy

US8334976B2 · kind B2 · utility

Assignee

• The Board of Trustees of the University of Illinois · US

Inventors

• Paul Scott Carney · Champaign, US
• Kimani C. Toussaint · Brookline, US
• Brynmor J. Davis · Champaign, US
• Santosh Tripathi · Portland, US

Key dates

• Filing date: Jun 6, 2011
• Grant date: Dec 18, 2012
• Expiry date: Jul 18, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2021/4792
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A coherent confocal microscope and methods for measuring elements of the non-linear susceptibility of a nanoparticle, including, more particularly, all of the elements of the second-order susceptibility tensor of a single nanoparticle under permutation and Kleinman symmetry. Using a high numerical aperture lens, two-dimensional scanning and a vector beam shaper, the second-order nonlinear susceptibility is derived from a single confocal image. A forward model for the problem is presented and a computationally efficient data processing method robustly solves the inverse problem.