Blind blocking artifact measurement approaches for digital imagery
US8335401B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 9, 2010 |
| Grant date | Dec 18, 2012 |
| Priority date | — |
| Expiry date | Sep 18, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N19/48
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods of performing quantitative measurements of blocking artifacts in digital images and digital image sequences that are computationally efficient, and that employ no reference information in the measurement process. At least one normalized gradient image array is calculated, with reference to at least one specified gradient direction, from image pixel data contained in an image pixel array derived from a given digital image. The calculated results are accumulated into at least one profile array, and the data contained in the respective profile array is analyzed in the frequency domain to obtain a quantitative measurement of blockiness in the given digital image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.