Method and system for artifact reduction
US8335664B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 18, 2009 |
| Grant date | Dec 18, 2012 |
| Priority date | — |
| Expiry date | Sep 13, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/4836
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is presented for obtaining characteristics of a target physical entity by providing an excitation signal to the target physical entity and simultaneously measuring the response of the target physical entity. Analog signal processing is performed on the measured response to eliminate artifacts arising from a signal path outside the target physical entity and determining the characteristics from the signal processed measured response. The excitation signal and the analog signal processing are selected such that after analog signal processing of the measured signal, the analog measured signal contains artifacts which are localized in time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.