Test and measurement instrument with bit-error detection
US8335950B2 · kind B2 · utility
3Cited by
6References
3Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 1, 2009 |
| Grant date | Dec 18, 2012 |
| Priority date | — |
| Expiry date | Jun 4, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/0061
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A test and measurement instrument including an input configured to receive a signal and output digitized data; a memory configured to store reference digitized data including a reference sequence; a pattern detector configured to detect the reference sequence in the digitized data and generate a synchronization signal in response; a memory controller configured to cause the memory to output the reference digitized data in response to the synchronization signal; and a comparator configured to compare the reference digitized data output from the memory to the digitized data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.