Patent · US Active

Microelectromechanical system testing device

US8336670B2 · kind B2 · utility

5Cited by

4References

20Claims

0Family size

Assignee

RASCO GMBH · DE

Inventors

Michael Viehmann · Rosenheim, DE
Werner Schütz · Raubling, DE
Alexander Josef Waldauf · Kufstein, AT

Key dates

Filing date	Feb 22, 2011
Grant date	Dec 25, 2012
Priority date	—
Expiry date	Feb 22, 2031

Classification

Technology area (CPC H)Electricity
CPC primaryH04R19/005
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

The invention provides a microelectromechanical system testing device, comprising an acoustic chamber having two opposing walls; a sound source for generating sound within the acoustic chamber at a first frequency in the range of 20 Hz to 10 kHz, the sound source being arranged at one of the opposing walls; and an interface for coupling one or more microelectromechanical systems thereto, the interface being arranged at the other of the two opposing walls and comprising a respective coupling site for each microelectromechanical system; wherein the acoustic chamber is adapted to have a total harmonic distortion (THD) at each coupling site of the interface for the first frequency below 1%, preferably below 0.8%, more preferably below 0.6%, most preferably below 0.4% when including all harmonics of the first frequency in the range of 20 Hz to 20 kHz, in particular for the first frequency being 1 kHz or 4 kHz.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.