Universal test system for controlling a plurality of parameters concerning the operation of a device for presenting optoelectronic information of various types
US8339464B2 · kind B2 · utility
2Cited by
27References
5Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 21, 2008 |
| Grant date | Dec 25, 2012 |
| Priority date | — |
| Expiry date | Feb 5, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2320/0693
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
According to the invention, the test system uses a digital photography device (4) that can be remotely controlled from a computer system including a processor (20) coupled to a man/machine interface (21) and to the presentation device to be tested by a remote transmission means. A means is further provided for centering the photographic apparatus (4) opposite the presentation device (5) to be tested. The processor (20) is programmed so as to carry out a self-positioning phase of the photographic apparatus, an automatic focalization phase of the lens, and a test phase of the information presentation device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.